MJC
Probe cards for use in connection with inspection of semiconductors and liquid crystal display panels
Owned by: Kabushiki Kaisha Nihon Micronics
Serial Number: 78939416
MJC PROBING THE FUTURE
Filed: January 13, 2011
Repair and maintenance of probe cards for use in inspection of semi-conductors
Owned by: Kabushiki Kaisha Nihon Micronics
Serial Number: 85217239
SCRUZ
Filed: March 6, 2018
Electrical sockets in the nature of integrated circuit sockets; electrical connectors; electrical and electronic components…
Owned by: Kabushiki Kaisha Nihon Micronics
Serial Number: 87821966
BEECONTACTS
Filed: November 6, 2019
(Based on 44(e)) (Based on Use in Commerce) Electric contacts; Measuring apparatus, namely, electronic devices for measuring…
Owned by: Kabushiki Kaisha Nihon Micronics
Serial Number: 88682133
MICRONICS JAPAN
Filed: July 21, 2022
Probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection…
Owned by: Kabushiki Kaisha Nihon Micronics
Serial Number: 97513203
