GLOBALDYNE
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76660926
COMPLETEEASE
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76663973
RC2
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76668600
ELLIPSOMETRY SOLUTIONS
MATERIALS TESTING AND ANALYZING FOR OTHERS, NAMELY, ELLIPSOMETRY SERVICES
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76677895
E
Materials testing and analyzing for others, namely, ellipsometry services
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76677896
ACCUMAP-SE
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR INVESTIGATING LARGE SAMPLES AT MANY LOCATIONS THEREON RESULTING IN DATA…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76689653
G-VASE
Laboratory research, namely, investigating samples of substrates with and without surface layers by using ellipsometers,…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 76703769
T-SOLAR
Filed: July 12, 2010
Ellipsometers, polarimeters and reflectometers which utilize electromagnetic radiation for investigating samples consisting…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76703770
THZ-VASE
Filed: May 31, 2011
equipment, namely, ellipsometer based apparatus for measuring thickness, temperature caused effects, and optical properties…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76707791
J.A. WOOLLAM CO.
Filed: July 19, 2011
technical services performed in the field of design of ellipsometers, polarimeters and spectrophotometers which utilize…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76708405
AUTORETARDER
Filed: April 23, 2012
ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76711308
WOOLLAM
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS, TEMPERATURE CAUSED EFFECTS, AND OPTICAL PROPERTIES…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76714996
WOOLLAM
Filed: February 18, 2014
LABORATORY RESEARCH, NAMELY, INVESTIGATING SAMPLES WITH AND WITHOUT SURFACE LAYERS BY USING ELLIPSOKETERS, POLARIMETERS…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76715843
WOOLLAM-ISM
INTENT TO USE TO IDENTIFY EQUIPMENT, namely, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76720244
J.A. WOOLLAM-ISE
MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE…
Owned by: J.A. WODLLAM CO., INC.
Serial Number: 76720245
E J.A. WOOLLAM ISE
Filed: May 21, 2018
Equipment, namely, ellipsometer based apparatus for measuring thickness and optical properties of semiconductor, disk drive…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76720518
THETA-SE
Filed: April 9, 2019
IDENTIFIES EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR…
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 76720671
SNAPSHOT ELLIPSOMETER
Filed: May 27, 2022
Optical frequency metrology devices
Owned by: J.A. WOOLLAM CO., INC.
Serial Number: 97431899
