NANO SCOPE
Filed: July 31, 1987
SCANNING TUNNELING MICROSCOPE
Owned by: BRUKER NANO, INC.
Serial Number: 73675621
NANO PROBES
Filed: May 3, 1990
tips in the nature of micromachined protrusions on the end of flexible cantilevers for measuring the profile of a surface…
Owned by: BRUKER NANO, INC.
Serial Number: 74055328
VISION
Filed: July 15, 1994
computer software for interferometric instruments used for making surface measurements of a sample and/or wavefront-shape…
Owned by: BRUKER NANO, INC.
Serial Number: 74549835
TRIBOSCOPE
Filed: July 12, 1995
micromechanical testing instruments comprised of probe, transducer, electrostatic controller, and computer firmware for…
Owned by: BRUKER NANO, INC.
Serial Number: 74700334
TRIBO
Filed: July 24, 1995
micromechanical testing instruments comprised of probe, transducer, electrostatic controller, and computer firmware for…
Owned by: BRUKER NANO, INC.
Serial Number: 74704385
TRIBOINDENTER
Filed: June 10, 1997
micromechanical testing instruments comprised of probe, transducer, electrostatic controller, and computer firmware for…
Owned by: BRUKER NANO, INC.
Serial Number: 75306480
MULTIMODE
Filed: June 16, 1997
atomic force microscopes and associated computer software for use in characterizing or analyzing the properties of samples…
Owned by: BRUKER NANO, INC.
Serial Number: 75309372
TIPX
Filed: October 24, 1997
microscopes and the computer software that operates microscopes
Owned by: BRUKER NANO, INC.
Serial Number: 75378810
ECO-SNOW
Filed: July 14, 1999
CARBON DIOXIDE PROCESSING AND CLEANING SYSTEMS AND COMPONENTS THEREOF NAMELY AN ENCLOSED PROCESSING/CLEANING ASSEMBLY, C02…
Owned by: BRUKER NANO, INC.
Serial Number: 75751354
NANOMAN
Filed: February 16, 2001
Equipment, namely off-the-shelf components and proprietary software used for the manipulation of small quantities of materials…
Owned by: BRUKER NANO, INC.
Serial Number: 76211573
PICOFORCE
ANALYTICAL INSTRUMENTATION, NAMELY, ATOMIC FORCE MICROSCOPE FOR THE DETECTION AND MEASUREMENT OF MINUTE INTERACTIONS, SUCH…
Owned by: BRUKER NANO, INC.
Serial Number: 76309066
DIGITAL INSTRUMENTS
SCIENTIFIC AND TECHNOLOGICAL RESEARCH AND DEVELOPMENT OF PRODUCTS FOR OTHERS, NAMELY ATOMIC FORCE MICROSCOPES AND SCANNING…
Owned by: BRUKER NANO, INC.
Serial Number: 76383240
DEKTAK
Filed: March 12, 2002
surface measurement instrumentation, namely stylus based surface profilers, four-point resistivity probes, atomic force…
Owned by: BRUKER NANO, INC.
Serial Number: 76384268
PICOANGLER
handheld tool used to explore tip-sample interactions manually, relative to force spectroscopy research
Owned by: BRUKER NANO, INC.
Serial Number: 76384269
NANODMA
Filed: March 27, 2002
Micromechanical Testing Instruments Comprised of Probe, Transducer, Electrostatic Controller, and Computer Firmware for…
Owned by: BRUKER NANO, INC.
Serial Number: 76387670
DIMENSION
Filed: June 24, 2002
PROBE BASED TOOL USED TO CREATE IMAGES OF SUBMICRON SCALE FEATURES, NAMELY TOPOGRAPHICAL, PHYSICAL, CHEMICAL, ELECTRICAL…
Owned by: BRUKER NANO, INC.
Serial Number: 76424468
PICOINDENTER
Micromechanical Testing Instruments Comprised of Probe, Transducer, Electrostatic Controller, and Computer Firmware for…
Owned by: Hysitron, Incorporated
Serial Number: 76517000
ENVIROSCOPE
SCANNING PROBE MICROSCOPES
Owned by: BRUKER NANO, INC.
Serial Number: 76518068
MASKCLEAN
Filed: January 5, 2007
CO2 snow cleaning systems, primarily composed of carbon dioxide (CO2) filled cylinders and attached nozzles, tubing, and…
Owned by: BRUKER NANO, INC.
Serial Number: 77076955
VERSACLEAN
Filed: January 5, 2007
CO2 snow cleaning systems, primarily composed of carbon dioxide (CO2) filled cylinders and attached nozzles, tubing, and…
Owned by: BRUKER NANO, INC.
Serial Number: 77076999
PRECISIONCLEAN
Filed: February 8, 2007
High purity gas, namely carbon dioxide for industrial cleaning processes
Owned by: BRUKER NANO, INC.
Serial Number: 77102573
INNOVA
Metrology instruments and components thereof, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs…
Owned by: BRUKER NANO, INC.
Serial Number: 77156373
INSIGHT
Metrology instruments and components thereof, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs…
Owned by: BRUKER NANO, INC.
Serial Number: 77156386
WAFERCLEAN
Filed: September 4, 2007
CARBON DIOXIDE PROCESSING AND CLEANING SYSTEMS AND COMPONENTS THEREOF, NAMELY, AN ENCLOSED PROCESSING/CLEANING ASSEMBLY,…
Owned by: BRUKER NANO, INC.
Serial Number: 77271136
HYSITRON
Nanomechanical testing instruments with and without in situ test capability comprising of probe, transducer, controller…
Owned by: Hysitron, Inc.
Serial Number: 77300860
Image Trademark
Nanomechanical testing instruments with and without in situ test capability comprising of probe, transducer, controller…
Owned by: Hysitron, Inc.
Serial Number: 77300895
SEEING IS BELIEVING
Mechanical testers in the nature of micro- and nanomechanical testing instruments for conducting compression, tensile, indentation…
Owned by: Hysitron, Incorporated
Serial Number: 77484323
ICON
Metrology instruments and components thereof, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs…
Owned by: BRUKER NANO, INC.
Serial Number: 77546216
HARMONIX
Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs…
Owned by: BRUKER NANO, INC.
Serial Number: 77557231
MIRO
Filed: August 28, 2008
Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs…
Owned by: BRUKER NANO, INC.
Serial Number: 77558171
SNOWSTRIP
Filed: May 20, 2009
pressurized gas vessels or containers in the nature of carbon dioxide snow blended with at least one solvent and/or at least…
Owned by: BRUKER NANO, INC.
Serial Number: 77741212
NANOSNOW
Filed: May 20, 2009
Carbon dioxide based cryogenic aerosol cleaning equipment including nozzles, filters, gas delivery and blending components…
Owned by: BRUKER NANO, INC.
Serial Number: 77741222
SCANASYST
Filed: February 23, 2010
SOFTWARE FOR OPERATING PROBE-BASED INSTRUMENTS; PROBE-BASED INSTRUMENTS IN THE FIELDS OF MANUFACTURING AND SCIENTIFIC RESEARCH…
Owned by: BRUKER NANO, INC.
Serial Number: 77942622
PEAKFORCE QNM
Filed: February 23, 2010
SOFTWARE FOR OPERATING PROBE-BASED INSTRUMENTS IN THE FIELDS OF MANUFACTURING AND SCIENTIFIC RESEARCH; HARDWARE FOR FACILITATING…
Owned by: BRUKER NANO, INC.
Serial Number: 77942645
PRECISIONCLEAN
Filed: September 7, 2004
POWER OPERATED CRYOGENIC CLEANING TOOLS AND COMPONENTS THEREOF, NAMELY, CRYOGENIC AEROSOL PROCESSING AND CLEANING TOOLS…
Owned by: BRUKER NANO, INC.
Serial Number: 78479254
BROADBAND AFM
Metrology instruments, namely, scanning probe microscopes (SPM), namely, atomic force microscopes (AFM)
Owned by: BRUKER NANO, INC.
Serial Number: 78749656
CALIBER
Metrology instruments, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)
Owned by: BRUKER NANO, INC.
Serial Number: 78827831
NANOECR
Micromechanical instruments with electrical and mechanical characterization capabilities for data acquisition and testing…
Owned by: Hysitron, Inc.
Serial Number: 78863735
CONTOURGT
Filed: June 8, 2010
Metrology devices, namely, surface profiling machines for measuring surface primary form, surface roughness and other surface…
Owned by: BRUKER NANO, INC.
Serial Number: 85057707
VISION64
Filed: June 8, 2010
Computer software used in connection with metrology instruments or on a standalone basis for measuring and analyzing sample…
Owned by: BRUKER NANO, INC.
Serial Number: 85057742
