JUPITER
Filed: April 9, 2015
Electron beam inspection apparatus using scanning method
Owned by: ASML NETHERLANDS B.V.
Serial Number: 86592940
JUPITER
Filed: April 9, 2015
Installation and maintenance of electron beam inspection apparatus using scanning method
Owned by: ASML NETHERLANDS B.V.
Serial Number: 86592950
JUPITER
Filed: April 9, 2015
Inspection for defects on semiconductor specimens
Owned by: ASML NETHERLANDS B.V.
Serial Number: 86592957
SKYSCAN
Filed: January 21, 2016
Maintenance of semiconductor inspection tools
Owned by: ASML NETHERLANDS B.V.
Serial Number: 86881702
ASE
Filed: January 27, 2016
Software for image analysis for identification of defects in semiconductor wafers and reticles
Owned by: ASML NETHERLANDS B.V.
Serial Number: 86887647
ASE
Filed: January 27, 2016
Quality control for semiconductor manufacturers of semiconductor manufacturing using particle beams, namely, using ebeam…
Owned by: ASML NETHERLANDS B.V.
Serial Number: 86887655
