Optical apparatus and instruments, namely, electron microscopes; hardware, namely, electronic and optical apparatus for use in inspection and measurement of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples in particular for microscopic examination and quality control purposes; electric and electronic apparatus and instruments, namely, for microscopic examination; microscopes, electron microscopes and scanning electron microscopes; parts and fittings for all the aforesaid goods, namely, sample holders, lenses, lighting devices for microscopes; scientific and laboratory research apparatus, teaching apparatus and simulators, namely, vacuum chambers with precision mechanical stages and electron optical lenses, control software, programs and software applications for the analysis of data generated by the electron-detectors of the microscopes, electron microscopes and scanning electron microscopes; electron microscopes; semiconductor objectives; co-observation attachment in the nature of a lens, a detector, a specimen holder, an environmental temperature/humidity controller, an in-situ specimen manipulator, and a pretreatment device for microscope; spectrometers, namely, x-ray spectrometer for use in identifying and measuring elemental compositions of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples; electronic and optical instruments for measuring surfaces; scientific instruments, namely, optical microscopes, electron microscopes, spectrometers, chromatographs and automated medical assay apparatus for metrology measurement, microstructure imaging, composition analysis, chemical analysis, pathological examination and pathogens detection; optical apparatus and instruments for analyzing material, namely, electron probe micro analyzers, energy-dispersive x- ray fluorescence spectrometers, energy-dispersive x-ray spectrometers, x-ray fluorescence spectrometers; measuring or testing machines and instruments, namely, review systems for analyzing or measuring material, namely, wafer defect inspection instruments, pattern measuring instruments; containers for microscope slides; precision instruments for manipulation and positioning of microscopic objects; laboratory equipment, namely, microscope slides; bio-chips for research or scientific purposes; computer application software for metrology analysis, continues inspection, and series images storing, processing, analyzing and exporting for use in inspection and measurement of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples, in particular for microscopic examination and quality control purposes