Testing equipment for high speed electronics and optical communications; components and test measurement equipment for high speed electronics, including serial data electronics, in the nature of active components, namely linear amplifiers, driver amplifiers, limiting amplifiers, delay lines, and sampler circuitry; passive components, namely bias tees, low pass filters, power dividers, pick-off tees, attenuators, dc blocks, impulse forming networks, baluns and transformers; signal generation modules and instruments, namely, high-speed pulse/pattern modules/instruments, general purpose programmable pulse/pattern modules/instruments, error detector/measurement modules/instruments, clock recovery modules/instruments, programmable delay instruments/modules, pre/de-emphasis instruments/modules, Bit Error Rate Tester systems/instruments/modules, tdr/tdt modules; and signal measurement modules and instruments, namely equivalent time sampler modules, real time sampler modules, and general purpose sampler modules