Measuring apparatus and instruments; scientific apparatus and instruments; sensor; laboratory apparatus and instruments; laboratory equipment; measuring, regulating and testing apparatus; display and checking (supervision) apparatus; apparatus and instruments for industrial process monitoring and control; parts and fittings for the above goods; software and computer hardware; all of the aforesaid goods being specifically in connection with x-ray apparatus, in particular with x-ray radiography apparatus or x-ray imaging not for medical purposes, in particular in combination with small-angle x-ray scattering and/or wide-angle x-ray scattering; all of the aforesaid goods being specifically used for materials research, development or production control in the field of polymers, nanocomposites, biomaterials, alloys, in particular for analysis of the macrostructure at several microns to centimeter scale, in particular for detection of structural inhomogeneities, defects, voids, pores, aggregations, interfaces in such materials