Scientific, measuring and detecting apparatus and instruments, namely, diffractometers, X-ray diffractometers and wafer analysers; X-ray detecting apparatus and instruments not for medical purposes; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; X-ray detectors not for medical use; analytical apparatus for analysing samples in scientific, industrial and laboratory applications, namely, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and wafer analysers; materials characterization apparatus, in the nature of scientific and measuring apparatus and instruments, namely, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, namely diffractometers, X-ray diffractometers and X-ray diffraction meters; metrology tools, namely diffractometers, X-ray diffractometers and X-ray diffraction meters; diffraction apparatus for microscopy; diffraction apparatus and instruments; X-ray diffraction instruments; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for determining X-ray intensities, not for medical purposes; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with X-ray apparatus, not for medical purposes; component parts and fittings for all the aforesaid goods