Scientific, measuring and analytical apparatus for materials characterization, namely, x-rays, x-ray tubes, x-ray cameras, diffractometers, reflectometers, refractometers, x-ray typography apparatus and instruments, x-ray scattering apparatus and instruments, and spectroscopes for scientific use; x-ray metrology apparatus for semi-conductors and materials, namely, thin films, metallic thin films, multi-layers, ceramics, superconductors; apparatus and instruments for analyzing and testing thin films, metallic thin films, multi-layers, ceramics, superconductors, and semi-conductor materials; x-ray apparatus and instruments for scientific use; x-ray tubes for scientific use; x-ray cameras for scientific use; x-ray detectors for scientific use; diffractometers; reflectometers; x-ray topography apparatus and instruments; surface Brillouin scattering and surface Brillouin spectroscopy apparatus and instruments; powder, single crystal and high resolution diffraction measuring apparatus and instruments; computer hardware and computer software adapted for use with all the aforementioned goods sold as a unit; parts and fittings for all the aforementioned goods