spectrum analyzers; network analyzers; optical spectrum analyzers; optical network analyzers; optical time domain reflectmeter; digital multimeters; dc voltage/current generators; multi-channel digital recorder; frequency counters; pulse pattern generator; error detector; protocol analyzer; digital spectrum analyzers; bluetooth tester; laser diode test system; applied electronic machines and apparatus, namely, testers for testing semiconductors, namely, large scale integrated circuits (LSI) and very large scale integrated circuits (VLSI), system on a chip (SOC), logic, memory, flash memory, radio frequency integrated circuits (RFIC), mixed-signal, liquid crystal display (LCD) driver, image sensor, e-beam, and test handler; computer software for testing semiconductors namely, large scale integrated circuits and very large scale integrated circuits, system on a chip, logic, memory, flash memory, radio frequency integrated circuits, mixed-signal, liquid crystal display driver, image sensor, e-beam, and test handler for use in the civilian industry, namely, the telecommunications industry, the mobile communications industry, the network communications industry, the medical industry, the aircraft industry, and the household electronic appliance industry