Spectrum analyzers, network analyzers, optical spectrum analyzers, optical network analyzers, optical time domain reflect meter, digital multimeters, DC voltage/current generators, multi-channel digital recorder, frequency counters, pulse pattern generator, error detector, protocol analyzer, digital spectrum analyzers, bluetooth tester, laser diode test system; applied electronic machines and apparatus, namely, testers for testing semiconductors namely, large scale integrated circuits (LSI) and very large scale integrated circuits (VLSI), system on a chip (soC), memory, flash memory, radio frequency integrated circuits (RFIC), mixed-signal, liquid crystal display (LCD) driver; imagesensor, e-beam, and all other applied electronic machines and apparatus, and parts and accessories thereof, logic test system, test handler; computer software for applied electronic machines and apparatus for testing semiconductors namely, large scale integrated circuits and all other applied electronic machines and apparatus; prerecorded video discs and videotapes featuring provision of information or advice relating to price, performance, combination, operation, maintenance, and design with regard to the aforesaid machines and apparatus and software, parts and accessories thereof; downloadable electronic publications -in the nature of catalogue or specification in the field of provision of information or advice relating to price, performance, combination, operation, maintenance, and design with regard to the aforesaid machines and apparatus and software, parts and accessories thereof