FATHOM - Trademark Details
Status: 710 - Cancelled - Section 8
Serial Number
76347903
Registration Number
2807148
Word Mark
FATHOM
Status
710 - Cancelled - Section 8
Status Date
2010-08-27
Filing Date
2001-12-11
Registration Number
2807148
Registration Date
2004-01-20
Mark Drawing
1000 - Typeset: Word(s)/letter(s)/number(s)
Typeset
Published for Opposition Date
2003-01-14
Attorney Name
Law Office Assigned Location Code
L30
Employee Name
RAUEN, JAMES A
Statements
Goods and Services
Inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes, for use in the manufacturing and testing of semiconductors
Goods and Services
Installation, maintenance and repair of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes
Goods and Services
Custom manufacture of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes
Goods and Services
On-site and off-site inspection services for the semiconductor industry, namely wafer inspection, reticle inspection, defect detection, defect review, defect classification, nanotopography measurement, wafer flatness measurement, surface profiling, film thickness measurement, critical dimension measurement, and microscopy; and leasing and consultation of inspection and test equipment for the semiconductor industry, namely wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes; design of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes
Classification Information
International Class
9 - Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin-operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus. - Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin-operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
US Class Codes
021, 023, 026, 036, 038
Class Status Code
2 - Sec. 8 - Entire Registration
Class Status Date
2010-08-27
Primary Code
009
First Use Anywhere Date
2002-07-03
First Use In Commerce Date
2002-07-03
International Class
37 - Building construction; repair; installation services. - Building construction; repair; installation services.
US Class Codes
100, 103, 106
Class Status Code
2 - Sec. 8 - Entire Registration
Class Status Date
2010-08-27
Primary Code
037
First Use Anywhere Date
2002-07-03
First Use In Commerce Date
2002-07-03
International Class
40 - Treatment of materials. - Treatment of materials.
US Class Codes
100, 103, 106
Class Status Code
2 - Sec. 8 - Entire Registration
Class Status Date
2010-08-27
Primary Code
040
First Use Anywhere Date
2002-07-03
First Use In Commerce Date
2002-07-03
International Class
42 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software; legal services. - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software; legal services.
US Class Codes
100, 101
Class Status Code
2 - Sec. 8 - Entire Registration
Class Status Date
2010-08-27
Primary Code
042
First Use Anywhere Date
2002-07-03
First Use In Commerce Date
2002-07-03
Correspondences
Name
PAMELA S. RATLIFF
Address
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Trademark Events
| Event Date | Event Description |
| 2002-03-13 | ASSIGNED TO EXAMINER |
| 2002-03-27 | NON-FINAL ACTION MAILED |
| 2002-09-24 | PAPER RECEIVED |
| 2002-09-24 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| 2002-11-06 | EXAMINERS AMENDMENT MAILED |
| 2002-11-14 | APPROVED FOR PUB - PRINCIPAL REGISTER |
| 2002-12-25 | NOTICE OF PUBLICATION |
| 2003-01-14 | PUBLISHED FOR OPPOSITION |
| 2003-04-08 | NOA MAILED - SOU REQUIRED FROM APPLICANT |
| 2003-10-06 | PAPER RECEIVED |
| 2003-10-06 | EXTENSION 1 FILED |
| 2003-10-06 | USE AMENDMENT FILED |
| 2003-11-06 | EXTENSION 1 GRANTED |
| 2003-11-10 | STATEMENT OF USE PROCESSING COMPLETE |
| 2003-11-21 | CASE FILE IN TICRS |
| 2003-11-24 | ASSIGNED TO EXAMINER |
| 2003-11-26 | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED |
| 2004-01-20 | REGISTERED-PRINCIPAL REGISTER |
| 2010-08-27 | CANCELLED SEC. 8 (6-YR) |
