MICRO-OPTICAL COMPONENTS, NAMELY, LENSES, BALL LENSES, LENS ARRAYS, MIRRORS, PRISMS, BEAM SPLITTERS, FIBER OPTIC ARRAYS, COLLIMATORS, COLLIMATOR ARRAYS FOR USE IN FIBER OPTIC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; MICRO-BALL LENSES AND MICRO-LENSES FOR USE IN FIBER OPTIC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; OPTICAL SWITCHES, OPTICAL FILTERS, TUNABLE OPTICAL FILTERS; MICRO-OPTICAL ASSEMBLIES, AND FIBER OPTIC ASSEMBLIES FOR USE IN OPTICAL NETWORKS; MICRO-OPTICAL MODULES FOR FIBER OPTIC NETWORKS AND SYSTEMS, MICRO-OPTIC INTERFEROMETERS FOR USE IN THE MEASUREMENT OF DEVIATION OF SURFACE SHAPE; DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRONIC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; ATMOSPHERIC INSENSITIVE DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRONIC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; RETICLE CRITICAL DIMENSION MEASURING EQUIPMENT PROVIDING NON-CONTAMINATED HANDS-OFF RETICLE MEASUREMENT AND INSPECTION; IN-PROCESS SILICON WAFER SURFACE TOPOGRAPHY MEASURING EQUIPMENT FOR USE IN PRECISION MEASUREMENT OF SILICON WAFER TOPOGRAPHY; OPTICAL DATA STORAGE HEADS AND DRIVES; SURFACE METROLOGY EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC RIGID DISK DRIVE HEADS AND SLIDERS; AND SURFACE EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC RIGID DISK DRIVE DISKS