Scientific, electrical, optical monitoring and measuring instruments namely, coating thickness measurement instruments,[ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments;] instruments for measuring thickness of coatings, alloy compositions, material analysis,[ porosity, electrical conductivity,] ferrite content,[ micro-hardness, ]and other properties of coatings and layers;[ magneto,- opto,- and electronic data recording media, namely, blank magnetic computer tapes and floppy discs;]computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; thicknesses measurement instruments that use[ ultra sound and ]electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thickness of metal for measurement; x-ray detectors; x-ray tubes not for medical purposes; computer software for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments

[Product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; computer services, namely, designing and implementing web sites for others]